| Page 124 | American University of Sharjah

Photoluminescence Spectroscopy

TCSPC, Quantum Yield, Anisotropy, NIR, Lifetime measurements

Manufacturer / Vendor: 
Edinbourg Instruments
Model: 
FS5
Building: 
Room Number: 
0014
Functionality: 
Studies optical/electronic properties of semiconductors and molecules; includes electroluminescence measurements.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Puspendu Barik
Point of Contact Email: 
Status: 
Research Equipment Domain: 
Spectroscopy

UV-Vis Spectroscopy

200–3400 nm wavelength range, solid & liquid sample support

Manufacturer / Vendor: 
Shimadzu
Model: 
3600iplus
Building: 
Room Number: 
0014
Functionality: 
Measures absorbance/transmittance in UV-Vis range to identify substances and concentrations.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Puspendu Barik
Point of Contact Email: 
Status: 
Research Equipment Domain: 
Spectroscopy

High-Power Femtosecond Laser

IR pulses (300W, 50–150kHz), 40 fs – 5 ps, XY scanning, Galvo controller

Manufacturer / Vendor: 
ActiveFiber
Building: 
Room Number: 
0001
Functionality: 
Photoemission spectroscopy, transient absorption, nanomaterial synthesis, laser material processing, THz generation
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Ganjaboy Boltaev
Point of Contact Email: 
Status: 
Research Equipment Domain: 
Additive Manufacturing and Laser Processing

Raman Microscopy

532 & 785 nm excitation, Low-temp option, High-res confocal mapping

Manufacturer / Vendor: 
WITec
Model: 
Alpha 300R
Building: 
Room Number: 
0014
Functionality: 
Measures vibrational energy modes; reveals chemical structure, crystallinity, polymorphy, and molecular interactions.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Puspendu Barik
Point of Contact Email: 
Status: 
Research Equipment Domain: 
Spectroscopy

Scanning Probe Microscope

Multiple AFM modes (contact, non-contact, dynamic), MFM, EFM, STM

Manufacturer / Vendor: 
Nanomagnetics
Model: 
HpAFM
Building: 
Room Number: 
0019
Location: 
AD1-014
Functionality: 
Subnanometer imaging; surface roughness, electronic structure, and magnetic characterization at atomic scale.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Microscopy

HR - Scanning Electron Microscope

EBSD for crystallographic mapping, SE, BSE, and EDX capabilities

Manufacturer / Vendor: 
TESCAN
Model: 
Magna (Field Emission)
Building: 
Room Number: 
0006
Functionality: 
Offers superior resolution SEM imaging and elemental analysis.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Microscopy

Scanning Electron Microscope

SE Detector (Topography), BSE Detector (Compositional), EDX (Elemental Analysis)

Manufacturer / Vendor: 
TESCAN
Model: 
Vega 3 (Thermoionic emission)
Building: 
Room Number: 
0006
Functionality: 
Uses electron beam to magnify images, exploiting wave-like behavior of electrons, unlike optical microscopes.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Microscopy

X-Ray Diffractometer (XRD)

Grazing-angle diffraction, Residual Strain Analysis, Phase composition, Crystal structure, Crystallite size, Temp. stage (80–750 K)

Manufacturer / Vendor: 
Malvern Panalytical
Model: 
X'Pert³ Powder
Building: 
Room Number: 
0002
Functionality: 
Analyzes phase composition, crystal structure, and orientation of powder, solid, and liquid samples.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Manoj Mohan
Point of Contact Email: 
Status: 
Research Equipment Domain: 
Coating and Surface Characterization

Pages

You are now leaving the American University of Sharjah website.

By continuing, you will be taken to a website not affiliated with American University of Sharjah. Links to external sites are provided only for users' convenience and imply no endorsement of the site and/or its content. Note that the privacy policy and security settings of the linked site may differ from those of the AUS website.

Open link