Microscopy | American University of Sharjah
S

Digital Microscope Smart Proof 5

August 11, 2025 10:10 PM

Widefield confocal microscope; fast and repeatable surface/topography analysis

Manufacturer / Vendor: 
ZEISS
Model: 
Smart Proof 5
Building: 
Room Number: 
0016
Functionality: 
Roughness, material surface, 3D topography characterization
Custodian Department / Unit: 
Mechanical Engineering
Point of Contact Name: 
Wael Abuzaid
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Microscopy

Photron NOVA S6 High Speed Camera

August 11, 2025 10:02 PM

1 MP resolution; 5000 fps

Manufacturer / Vendor: 
Photron
Model: 
NOVA S6
Building: 
Room Number: 
2084
Location: 
Mechanical Engineering, ESB 2084
Functionality: 
Research on materials’ response to impact/dynamic loads
Custodian Department / Unit: 
Mechanical Engineering
Point of Contact Name: 
Maen Alkhader
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Microscopy

Scanning Probe Microscope

August 11, 2025 04:52 PM

Multiple AFM modes (contact, non-contact, dynamic), MFM, EFM, STM

Manufacturer / Vendor: 
Nanomagnetics
Model: 
HpAFM
Building: 
Room Number: 
0019
Location: 
AD1-014
Functionality: 
Subnanometer imaging; surface roughness, electronic structure, and magnetic characterization at atomic scale.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Microscopy

HR - Scanning Electron Microscope

August 11, 2025 04:49 PM

EBSD for crystallographic mapping, SE, BSE, and EDX capabilities

Manufacturer / Vendor: 
TESCAN
Model: 
Magna (Field Emission)
Building: 
Room Number: 
0006
Functionality: 
Offers superior resolution SEM imaging and elemental analysis.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Microscopy

Scanning Electron Microscope

August 11, 2025 04:44 PM

SE Detector (Topography), BSE Detector (Compositional), EDX (Elemental Analysis)

Manufacturer / Vendor: 
TESCAN
Model: 
Vega 3 (Thermoionic emission)
Building: 
Room Number: 
0006
Functionality: 
Uses electron beam to magnify images, exploiting wave-like behavior of electrons, unlike optical microscopes.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Microscopy

© 2025 American University of Sharjah. All rights reserved.

You are now leaving the American University of Sharjah website.

By continuing, you will be taken to a website not affiliated with American University of Sharjah. Links to external sites are provided only for users' convenience and imply no endorsement of the site and/or its content. Note that the privacy policy and security settings of the linked site may differ from those of the AUS website.

Open link