Coating and Surface Characterization | American University of Sharjah
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RF Sputtering System

August 11, 2025 08:02 PM

DC/RF sputter, 1–2 inch targets, high vacuum, substrate rotation

Model: 
N/A
Building: 
Room Number: 
0001
Functionality: 
Thin film deposition, metal/oxide coatings, device fabrication
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization

Drop Shaped Analyzer System

August 11, 2025 07:38 PM

Contact angle, drop shape, high-speed imaging

Manufacturer / Vendor: 
KRUSS Scientific
Model: 
DSA100
Building: 
Room Number: 
0005
Functionality: 
Analyzes droplet dynamics under varying temperature and humidity
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Chaudry Sajed Saraj
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization

Surface Profiler

August 11, 2025 07:33 PM

Non-contact 3D profiling, high-resolution imaging

Manufacturer / Vendor: 
Profilm 3D
Model: 
N/A
Building: 
Room Number: 
0005
Functionality: 
Surface roughness and finish analysis
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Chaudry Sajed Saraj
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization

X-Ray Photoelectron Spectroscopy (XPS)

August 11, 2025 07:17 PM

Monochromated X-ray, dual anode, micro-focusing, ARXPS, cluster ion source

Manufacturer / Vendor: 
ThermoFisher
Model: 
ESCALAB QXi
Building: 
Room Number: 
0019
Functionality: 
Elemental and chemical surface analysis, oxidation states, catalyst studies, surface reactions before/after
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Maduraiveeran Govindhan
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Spectroscopy

Atomic Layer Deposition & Glovebox

August 11, 2025 05:08 PM

4” chuck, multi-precursor, RT–320°C chamber, 180°C precursors

Manufacturer / Vendor: 
Anric
Model: 
AT410
Building: 
Room Number: 
0002
Functionality: 
ALD thin-film technique using alternate gaseous precursor exposure
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Maduraiveeran Govindhan
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization

Pulsed Laser Deposition System

August 11, 2025 05:06 PM

KrF excimer laser (248 nm), 6-target co-ablation, high vacuum 1E-8 mbar

Manufacturer / Vendor: 
Neocera
Model: 
Pioner 180
Building: 
Room Number: 
0001
Functionality: 
Nano-layer growth of electronic, optical, photovoltaic materials.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Manoj Mohan
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization

HR - Scanning Electron Microscope

August 11, 2025 04:49 PM

EBSD for crystallographic mapping, SE, BSE, and EDX capabilities

Manufacturer / Vendor: 
TESCAN
Model: 
Magna (Field Emission)
Building: 
Room Number: 
0006
Functionality: 
Offers superior resolution SEM imaging and elemental analysis.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Microscopy

Scanning Electron Microscope

August 11, 2025 04:44 PM

SE Detector (Topography), BSE Detector (Compositional), EDX (Elemental Analysis)

Manufacturer / Vendor: 
TESCAN
Model: 
Vega 3 (Thermoionic emission)
Building: 
Room Number: 
0006
Functionality: 
Uses electron beam to magnify images, exploiting wave-like behavior of electrons, unlike optical microscopes.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Muhammed Razi Paleth
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization
Microscopy

X-Ray Diffractometer (XRD)

August 11, 2025 04:31 PM

Grazing-angle diffraction, Residual Strain Analysis, Phase composition, Crystal structure, Crystallite size, Temp. stage (80–750 K)

Manufacturer / Vendor: 
Malvern Panalytical
Model: 
X'Pert³ Powder
Building: 
Room Number: 
0002
Functionality: 
Analyzes phase composition, crystal structure, and orientation of powder, solid, and liquid samples.
Custodian Department / Unit: 
Materials Research Center
Point of Contact Name: 
Dr. Manoj Mohan
Point of Contact Email: 
[email protected]
Status: 
Research Equipment Domain: 
Coating and Surface Characterization

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