Scanning Probe Microscope
August 11, 2025 04:52 PM
Multiple AFM modes (contact, non-contact, dynamic), MFM, EFM, STM
Equipment Images:
Manufacturer / Vendor:
Nanomagnetics
Model:
HpAFM
Building:
Room Number:
0019
Functionality:
Applications:
Subnanometer imaging; surface roughness, electronic structure, and magnetic characterization at atomic scale.
Custodian Department / Unit:
Point of Contact Name:
Dr. Muhammed Razi Paleth
Point of Contact Email:
Status:
